Article Sections
Structural, electronic and magnetic investigations on PLD based La2Ni1-xFexMnO6 disordered thin films
Loading author information...
Graphical Abstract & Abstract
The double perovskite materials show the magnetic semiconductor, magneto-optic and magneto-capacitance like interesting properties. It is predicted that the B-site substitution in this system may results in interesting properties. La2Ni1-xFexMnO6 thin films are deposited on Pt/Ti/ Si(100) substrate by Pulse Laser Deposition (PLD) technique. The films were uniform, fine grain and stoichiometric deposited at very low O2 pressure. The XRD of La2Ni1-xFexMnO6 thin films exhibits rhombohedral (R-3) phase. The peak broadening appears in Raman spectra at antistretching (518 cm -1 ) and stretching (656 cm -1 ) modes with presence of overtone modes at 1308 cm -1 in La2Ni1-xFexMnO6 thin film samples. XPS analysis reveals the presence of La 3+ , NiO, Ni 3+ , Fe 3+ , Mn 3+ and oxygen vacancies in samples. The Ni 3+ and Mn 3+ antiferromagnetic coupling is responsible for decrease in saturation magnetization Ms from 4.78 to 2.74 µB/f.u as Fe substitution increases from 0.1 to 0.3 at 5K. The increase
How to Cite
(2017). Structural, electronic and magnetic investigations on PLD based La2Ni1-xFexMnO6 disordered thin films. Advanced Materials Letters, 8(10), 958-964. https://doi.org/10.5185/amlett.2017.1518
